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1

Implementation of self-checking two-level combinational logic on FPGA and CPLD circuits

Mile K Stojčev, Goran Lj Djordjević, Tatjana R Stanković

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 257 KB

english, 2004

2

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Said Hamdioui, Kluwer Academic Publishers, Boston, 2004, Hardcover, pp. 221, plus XX, euro 109, ISBN 1-4020-7752-1

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 59 KB

english, 2005

3

Behrouz A. Forouzan, ,Data Communications and Networking Third edition (2003) McGraw-Hill Higher Education,Boston 0-07-251584-8 Softcover, pp. 973, plus XXXIV.

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 220 KB

english, 2005

4

Cory L. Clark, ,LabVIEW Digital Signal Processing and Digital Communications (2005) McGraw Hill,New York 0-07-144492-0 205 pp., Hardcover, plus XIII.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 69 KB

english, 2008

5

Reliability of Computer Systems and Networks: Fault Tolerance, Analysis and Design; Martin L. Shooman. John Wiley and Sons Inc., New York; 2002. Hardcover, pp. 528, plus XXII.

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 210 KB

english, 2004

6

Carl Hamacher, Zvonko Vranesic, Safwat Zaky, Computer Organization, Fifth edition, 2004, ISBN 0-07-112214-4. Hardcover, pp. 805, plus XX

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 213 KB

english, 2005

7

William C. Dunn, ,Introduction to Instrumentation, Sensor, and Process Control (2005) Artech House,Boston 1-58053-011-7 332 pp., Hardcover, plus XIII.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 64 KB

english, 2008

8

William C.Y. Lee, ,Wireless & Cellular Telecommunications third ed. (2006) McGraw Hill,New York 0-07-143686-3 Hardcover, 822 pp., plus XXIII.

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 73 KB

english, 2007

9

Boris Murmann, Bernhard Boser, Digitally Assisted Pipeline ADCs: Theory and Implementation, Kluwer Academic Publishers, Boston, 2004, ISBN 1-4020-7839-0. Hardcover, pp. 155, plus XX, euro 105

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 210 KB

english, 2005

10

Data structures with C++ using STL, 2/e: William Ford, William Top (Eds.); Prentice Hall, Upper Saddle River, NJ, 2002, 1037 pages, hardcover, ISBN 0-13-085850-1, plus XXVI

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 48 KB

english, 2003

11

Alberto Leon-Garcia, Indra Widjaja, Communication Networks: Fundamental Concepts and Key Architectures, Second edition, McGraw Hill Higher Education, Boston, 2004, ISBN 0-07-119848-2. Hardcover, pp. 900, plus XXVII

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 214 KB

english, 2005

12

Stephen Brown Zvonko Vranesic, Fundamental of Digital Logic with Verilog Design, McGraw Hill, Boston, 2004, Hardcover, pp. 844, plus XX, ISBN 0-07-121359-7

Mile K. Stojcev

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 67 KB

english, 2006

13

Design of Energy-Efficient Application-Specific Instruction Set Processors (ASIPs), Tilman Glokler, Heinrich Meyr, Kluwer Academic Publishers, Boston, 2004, ISBN 1-4020-7730-0, Hardcover, pp. 234, plus XX, euro 113

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 60 KB

english, 2005

14

Digital Computer Arithmetic Datapath Design Using Verilog HDL, James E. Stine, Kluwer Academic Publishers, Boston, 2004, ISBN 1-4020-7710-6. Hardcover, pp. 180, plus XI, euro 122

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 56 KB

english, 2005

15

[IEEE TELSIIKS 2009 - 2009 9th International Conference on Telecommunication in Modern Satellite, Cable, and Broadcasting Services - Nis, Serbia (2009.10.7-2009.10.9)] 2009 9th International Conference on Telecommunication in Modern Satellite, Cable, and Broadcasting Services - Power management and energy harvesting techniques for wireless sensor nodes

Stojcev, Mile K., Kosanovic, Mirko R., Golubovic, Ljubisa R.

Year:

2009

Language:

english

File:

PDF, 395 KB

english, 2009

16

Book review: Intellectual property protection in VLSI designs: Theory and practice, Hardcover, pp. 183, plus XIX, 106 euro, Kluwer Academic Publishers, Boston, 2003, ISBN 1-4020-7320-8

Gang Qu, Miodrag Potkonjak, Mile Stojcev

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 199 KB

english, 2004

17

Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp. 178, plus XI, ISBN 1-4020-7235-X, €107

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 200 KB

english, 2004

18

Power estimation and optimization for VLIW-based embedded systems; Vittorio Zaccaria, Mariagiovanna Sami, Donatella Sciuto, Cristina Silvano. Hardcover, pp. 203, plus XXIV, 107 euro. Kluwer Academic Publishers, Boston, 2003. ISBN 1-4020-7377-1

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 200 KB

english, 2004

19

Oversampled delta-sigma modulators: analysis applications and novel topologies; Mücahit Kozak, Izzet Kale. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp. 226, plus XII, 112 euro. ISBN 1-4020-7420-4.

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 201 KB

english, 2004

20

Memory architecture exploration for programmable embedded systems; Peter Grun, Nikil Dutt, Alexandru Nicolau. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp. 128, plus XVII, 116 euro. ISBN 1-4020-7324-0.

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 209 KB

english, 2004

21

Networks on Chip; Axel Jantsch, Hannu Tenhunen (Eds.). Kluwer Academic Publishers, Boston; 2003. Hardcover, pp. 303, plus VIII, euro 117. ISBN 1-4020-7392-5

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 214 KB

english, 2004

22

Low-voltage CMOS log companding analog design; Francisco Sera-Graells, Andoracion Rueda, Jose L. Huertas. Kluwer Academic Publishers, Boston; 2003. Hardcover, pp. 192, plus XXV, 117 euro. ISBN 1-4020-7445-X

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 211 KB

english, 2004

23

CMOS Telecom Data converters; Angel Rodriguez-Vazquez, Fernando Medeiro, Edmond Janssens, editors. Kluwer Academic Publishers, Boston; 2003. Hardcover, 588pp, plus XXXIII, 128 euro. ISBN 1-4020-7546-4

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 217 KB

english, 2004

24

Digital design and computer architecture; Hassan A. Farhat. CRC Press, Boca Raton: 2004. Hardcover, 487pp, plus XXII. ISBN 0-8493-1191-8

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 211 KB

english, 2004

25

Analog IP blocks

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 211 KB

english, 2005

26

Design and control of RF power amplifier; Alireza Shirvani, Bruce Wooley. Kluwer Academic Publishers, Boston; 2003. Hardcover, pp. 149, plus XVI, 127 euro. ISBN 1-4020-7562-6

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 211 KB

english, 2004

27

Yale N. Patt, Sanjay J. Patel, ,Introduction to Computing Systems: From Bits and Gates to C and Beyond Second edition (2004) McGraw-Hill Higher Education,Boston 0-07-121503-4 Softcover, pp. 632, plus XXIV.

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 217 KB

english, 2005

28

Gregory A. Matson, Tony R. Taylor, Julie N. Villar, Elements of STIL: Principles and Applications of IEEE Std. 1450, Kluwer Academic Publishers, Boston, 2003, Hardcover, pp. 291, plus XIX, euro 130, ISBN 1-4020-7637-1

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 59 KB

english, 2005

29

John. P. Hayes, Computer Architecture and Organization, Third ed., McGraw-Hill Book Company, Inc., Boston, 1988, Softcover, pp. 604, plus XIV, ISBN 0-07-115997-5

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 58 KB

english, 2006

30

Sachin Sapatnekar, Timing, Kluwer Academic Publishers, Hardcover, ISBN 1-4020-7671-1, pp. 294, plus IX, € 123.

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 60 KB

english, 2006

31

Richard Zurawski, editor. Embedded Systems Handbook, Hardcover, pp. 1112, plus XXXIV, $139,95, CRC Press, Taylor & Francis Group, Boca Raton, 2006, ISBN 0-8493-2824-1.

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 77 KB

english, 2007

32

Bert Haskell, ,Portable Electronics Product Design and Development (2004) McGraw Hill,New York 0-07-141639-0 Hardcover, pp. 372, plus XII.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 62 KB

english, 2008

33

Navabi Zainalabedin, ,Verilog Digital System Design: Register Transfer Level Synthesis, Testbench, & Verification second ed. (2006) McGraw Hill,New York 0-07-144564-1 Hardcover, pp. 384, plus XVI.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 63 KB

english, 2008

34

Joseph D. Dumas II, ,Computer Architecture: Fundamentals and Principles of Computer Design (2006) CRC Press an imprint of Taylor & Francis Group,Boca Raton 0-849-32749-0 Hardcover, pp. 372, plus XVI.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 63 KB

english, 2008

35

Robert B. Northrop, ,Introduction to Instrumentation and Measurement, 2/e (2005) CRC Press, Taylor & Francis Group,Boca Raton 0-8493-3773-9 743 pp., Hardcover, plus XXI.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 64 KB

english, 2008

36

Erik Larson, ,Introduction to Advanced System-on-Chip Test Design and Optimization (2005) Springer,Dordrecht 1-4020-3207-2 388 pp., Hardcover, plus XVIII.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 67 KB

english, 2008

37

Dimitris Gizopoulos, Antonis Paschalis, Yervant Zorian, ,Embedded Processor-Based Self Test (2004) Kluwer Academic Publishers,Dordrecht 1-4020-2785-0 217 pp., Hardcover, plus XV.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 76 KB

english, 2008

38

Wim Claes, Willy Sansen, Robert Puers, ,Design of Wireless Autonomous Data-Logger ICs (2006) Springer,Dordrecht 1-4020-3208-0 pp. 199, Hardcover, plus XVI.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 63 KB

english, 2008

39

Taxonomies for the Development and Verification of Digital Systems, Brian Bailey, Grant Martin, Thomas Anderson (Editors). Springer, New York (2005). 179 pp., Hardcover, ISBN: 0-387-24019-5.

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 65 KB

english, 2007

40

High-performance Energy-efficient Microprocessor Design, Vojin Oklobdzija, Ram K. Krishnamurthy (Eds.), Dordrecht, The Netherlands, Springer (2006). 338 pp., Hardcover, ISBN: 0-387-28594-6

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 67 KB

english, 2008

41

Alan Clements. Principles of Computer Hardware, fourth edition, Oxford University Press; (2006), Paperbound, pp. 656, plus XV, ISBN: 0-19-927313-8.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 67 KB

english, 2008

42

Clock aligner based on delay locked loop with double edge synchronization

Mile Stojčev, Goran Jovanović

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 234 KB

english, 2008

43

Tim Kogel, Rainer Leupers, Heinrich Meyr, ,Integrated System-Level Modeling of Network-on-Chip enabled Multi-Processors Platforms (2006) Springer,Dordercht 1-4020-4825-4 Hardcover, 199 pp., plus XIV.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 65 KB

english, 2008

44

Joseph Cavanagh, ,Sequential Logic: Analysis and Synthesis (2007) CRC Taylor and Francis Group,Boca Raton 0-8493-7564-9 Hardcover, pp. 896, plus XIII.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 63 KB

english, 2008

45

System on chip design languages; Anne Mignotte, Eugenio Villar, Lynn Horobin, editors, Kluwer Academic Publishers, Boston, 2002. Hardcover, pp. 283, plus IX, 141 €. ISBN 1-4020-7046-2

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 198 KB

english, 2004

46

Power Distribution Networks in High Speed Integrated Circuits; Andrey Mezhiba, Eby Friedman. Kluwer Academic Publishers, Boston; 2004. Hardcover, 280pp, plus XXIII, 129 euro. ISBN 1-4020-7534-0

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 211 KB

english, 2004

47

Layout-mixed-signal

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 212 KB

english, 2005

48

Data communication

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 214 KB

english, 2005

49

Vadim Ivanov, Igor Filanovsky, Operational Amplifier Speed and Accuracy Improvement: Analog Circuit Design with Structural Methodology, Kluwer Academic Publishers, Boston, 2004, Hardcover, pp. 194, plus XIV, euro 104, ISBN 1-4020-7772-6

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 211 KB

english, 2005

50

Low Power Electronics Design, Christian Pignet, Editor, CRC Press, Boca Raton, 2005, Hardcover, pp. 854, plus 18, ISBN 0-8493-1941-2

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 60 KB

english, 2006

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